#ifndef TESTS_H
#define TESTS_H

#include <gccore.h>
#include <stddef.h>

typedef enum { T_PENDING = 0, T_PASS, T_FAIL, T_SKIP } tstatus_t;

#define TMSG_LEN 72

typedef struct {
	const char *name;
	const char *what;                 /* one line: what this proves */
	int (*run)(char *msg, size_t n);  /* 0 = pass, 1 = fail, 2 = skip */
	tstatus_t   status;
	char        msg[TMSG_LEN];
} test_t;

typedef struct {
	const char *name;
	const char *what;
	test_t     *tests;
	int         ntests;
} suite_t;

extern suite_t  g_suites[];
extern const int g_nsuites;

/* Set once an NCRA reset has been issued this session.  The device ID is a
 * ONE-SHOT: reads of address 0 return it only until the first NCRA reset
 * clears id_phase in the gateware, after which address 0 reads back NCRA.
 * That is correct behaviour (it matches the GC's own init order), but it
 * means the ID test can only pass once per console power cycle. */

void tests_run_test(test_t *t);
void tests_run_suite(suite_t *s);
void tests_run_all(void);
void tests_reset_status(void);
void tests_tally(int *pass, int *fail, int *skip, int *pending);

#endif